Semiconductor chip including a substrate and multilayer part

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage

Reexamination Certificate

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Details

C257S618000, C257S620000, C257SE21559, C438S460000, C438S463000, C438S464000

Reexamination Certificate

active

07902636

ABSTRACT:
A semiconductor device is provided, which, when cutting a substrate formed with a multilayer part including a plurality of functional devices, makes it possible to cut the multilayer part with a high precision in particular. In a state where a protective tape22is attached to the front face16aof a multilayer part16, a substrate4is irradiated with laser light L while using its rear face4bas a laser light entrance surface, so as to form a modified region7within the substrate4along a line to cut, thereby generating a fracture24reaching the front face4aof the substrate4from a front-side end part7aof the modified region7. Attaching an expandable tape to the rear face4bof the substrate4and expanding it in the state where such a fracture24is generated can cut not only the substrate4but also the multilayer part16on the line to cut, i.e., interlayer insulating films17a,17b, with a favorable precision along the line to cut.

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