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Semicoductor device having defect type compound layer between si

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage
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Semiconductor and semiconductor substrate, method of...

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Semiconductor chip including a substrate and multilayer part

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Semiconductor device and a method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage
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Semiconductor device and fabrication method thereof

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Semiconductor device and manufacturing method therefor

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Semiconductor device and method of manufacturing the same with s

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Semiconductor device capable of blocking contaminants

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage
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Semiconductor device having defects of deep level generated by e

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Semiconductor device having layers with varying lifetime charact

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Semiconductor device having source and drain regions which inclu

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Semiconductor device including semiconductor memory element...

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Semiconductor device with deliberately damaged layer having...

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Semiconductor integrated circuit device having elements of diffe

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Semiconductor structure with different lattice constant...

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage
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Semiconductor substrate and method for producing the same

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Semiconductor substrate containing bulk micro-defect

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage
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Semiconductor switching device and method of controlling a...

Active solid-state devices (e.g. – transistors – solid-state diode – Including region containing crystal damage
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Semiconductor switching device having different carrier lifetime

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Substrate for growing electro-optical single crystal thin...

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