LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray imaging system using diffractive x-ray optics for high def

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray imaging system with active detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray inspection system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray inspection using co-planar pencil and fan beams

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray inspection with contemporaneous and proximal...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray inspection with contemporaneous and proximal...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray interface and condenser

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray lens

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray lens and method of manufacturing X-ray lens

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray lens system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray lithography scanning mirror

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray metrology using a transmissive x-ray optical element

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray micro diffractometer sample positioner

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray microbalance

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray microbeam generating method and device for the same

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray mirror and material

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray mirror system providing enhanced signal concentration

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray mirror, and x-ray exposure apparatus and device manufactur