X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-08-07
2009-06-30
Kao, Chih-Cheng G (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S057000
Reexamination Certificate
active
07555099
ABSTRACT:
An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams is mitigated by a combination of shielding, scatter detector design, positioning and orientation, and image processing. Image processing subtracts the measured radiation scattered from the transmission beam into the scatter detectors, reducing cross-talk.
REFERENCES:
patent: 3961186 (1976-06-01), Leunbach
patent: 4047029 (1977-09-01), Allport
patent: 4380817 (1983-04-01), Harding et al.
patent: 4525854 (1985-06-01), Molbert et al.
patent: 4768214 (1988-08-01), Bjorkholm
patent: 4799247 (1989-01-01), Annis et al.
patent: 4864142 (1989-09-01), Gomberg
patent: 4884289 (1989-11-01), Glockmann et al.
patent: 5016173 (1991-05-01), Kenet et al.
patent: 5065418 (1991-11-01), Bermbach et al.
patent: 5253283 (1993-10-01), Annis et al.
patent: 5313511 (1994-05-01), Annis et al.
patent: 5428657 (1995-06-01), Papanicoloploulos et al.
patent: 5430787 (1995-07-01), Norton
patent: 5600303 (1997-02-01), Husseiny et al.
patent: 5600700 (1997-02-01), Krug et al.
patent: 5638420 (1997-06-01), Armistead
patent: 5642393 (1997-06-01), Krug et al.
patent: 5692029 (1997-11-01), Husseiny et al.
patent: 5763886 (1998-06-01), Schulte
patent: 5764683 (1998-06-01), Swift et al.
patent: 5910973 (1999-06-01), Grodzins
patent: 5917880 (1999-06-01), Bjorkholm
patent: 5940468 (1999-08-01), Huang et al.
patent: 5954650 (1999-09-01), Saito et al.
patent: 5974111 (1999-10-01), Krug et al.
patent: 6151381 (2000-11-01), Grodzins et al.
patent: 6192104 (2001-02-01), Adams et al.
patent: 6249567 (2001-06-01), Rotschild et al.
patent: 6282260 (2001-08-01), Grodzins
patent: 6320933 (2001-11-01), Grodzins et al.
patent: 6421420 (2002-07-01), Grodzins
patent: 6459764 (2002-10-01), Chalmers et al.
patent: 6546072 (2003-04-01), Chalmers
patent: 6661867 (2003-12-01), Mario
patent: 6687326 (2004-02-01), Bechwati et al.
patent: 7072440 (2006-07-01), Mario
patent: 7092485 (2006-08-01), Kravis
patent: 2005/0185757 (2005-08-01), Kresse et al.
patent: 2005/0259781 (2005-11-01), Ying et al.
patent: 0 864 884 (1998-04-01), None
patent: 2 277 013 (1994-02-01), None
patent: WO 98/20366 (1997-07-01), None
patent: WO 2004/043740 (2004-05-01), None
Jul. 8, 2007, International Search Report.
Amer. Sci & Engineering, May 17, 2006, Press release for Gemini System.
Pailes Aaron D.
Rothschild Peter J.
Schubert Jeffrey R.
American Science and Engineering, Inc.
Bromberg & Sunstein LLP
Kao Chih-Cheng G
LandOfFree
X-ray inspection with contemporaneous and proximal... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray inspection with contemporaneous and proximal..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray inspection with contemporaneous and proximal... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4086066