X-ray imaging system

Details X-ray imaging system X-ray imaging system

2008-03-18

2008-03-18

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S084000

Reexamination Certificate

active

11340526

ABSTRACT:
To obtain an image that uses both an accurate spatial differential of an object-caused phase shift and the phase shift as contrast at a small observation field of view and under a simplified apparatus configuration , , , .a spatial differential of the object-caused phase shift and the phase shift are arithmetically obtained from the diffraction images of the object formed by simultaneous X-ray diffraction of crystals.

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