X-ray microbalance

Details X-ray microbalance X-ray microbalance

1991-11-12

1994-01-18

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 86, 378 89, G01B 1502

Patent

active

052805131

ABSTRACT:
A microbalance and method for measuring the total mass of small quantities of material (mass ranging from about 10 nanograms to about 0.1 gram) using Compton and Rayleigh scattered radiation provides excellent mass measurements for these samples. The apparatus includes a standard radiation generation and detection assembly, including a substantially evacuated chamber through which incident radiation travels, and commercially available radiation generators, power sources, and detectors, having enough spectral resolution to identify the scattered radiation of interest.

REFERENCES:
K. K. Nielson and R. W. Sanders "Multielement Analysis of Unweighed Biological and Geological Samples Using Backscatter and Fundamental Parameters" Advances in X-Ray Analysis, vol. 26, p. 385.
Richard J. Arthur and Ronald W. Sanders, "Backscatter/Fundamental-Parameters Analysis of Unweighed Samples Using Multi-Target, Multi-Crystal Regions of Interest From WDXRF and EDXRF" Pacific Northwest Laboratory (PNL), Richland, Wash.

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