X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-05-28
1992-08-25
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 34, 378145, G21K 106
Patent
active
051425610
ABSTRACT:
An X-ray lithography optical system has an elongated concave scanning mirror spaced a first predetermined distance from a source of X-rays. The mirror has a reflecting surface of part toroidal configuration having a first radius of curvature coincident with that of a torus of which the mirror is part and spaced opposite first and second ends having a second radius of curvature, different from the first radius of curvature, coincident with that of the circle which generates the torus. A photoresist is spaced a second predetermined distance from the mirror and positioned to receive X-rays reflected by the mirror. The second predetermined distance is greater than the first predetermined distance. A mask in proximity with the photoresist permits a predetermined pattern of X-rays to impinge on the photoresist and blocks all other X-rays.
REFERENCES:
patent: 4192994 (1980-03-01), Kastner
patent: 4949367 (1990-08-01), Huizing et al.
patent: 5031199 (1991-07-01), Cole, III et al.
Geib Richard G.
Grumman Aerospace Corporation
Howell Janice A.
Tick Daniel J.
Wong Don
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