LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Pole measuring method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Polynomial grating

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Pore- or particle-size distribution measurement apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Portable X-ray diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Portable x-ray diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Positioning device for an x-ray thickness measuring system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Powder diffraction method and apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Procedure and measuring apparatus based on X-ray diffraction for

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Process and apparatus for monitoring monocrystalline structures

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Process for inspecting monocrystalline material for precipitatio

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Production of monochromatic x-ray images of x-ray sources and sp

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Protective layer for multilayers exposed to x-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Protein crystal structure and method for identifying protein...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Providing X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Pseudo-random support structure for transmission gratings

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Pulsed X-ray reflectometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Quantitative analysis of the active table ingredient by power x-

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Quantitative determination of mineral composition by powder X-ra

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Radiation imaging system