Process and apparatus for monitoring monocrystalline structures

Details Process and apparatus for monitoring monocrystalline structures Process and apparatus for monitoring monocrystalline structures

1990-02-21

1991-05-14

Westin, Edward P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 84, 378 87, 378 62, 250206, 250307, G01N 2300, G01N 23207, G01N 2304, G21K 106

Patent

active

050162667

ABSTRACT:
An object (12) is irradiated by means of a divergent and polychromatic beam of X-rays for producing a diagram composed of Kikuchi pseudo-lines. An X-ray generator (4) is mounted on a stand (1), and an automatic handler (13) presents the objects (12) in confronting relation to the microfocus (F) of the generator. An intensity amplifier (6) and a video camera (7) record the obtained diagrams composed of the pseudo-lines. The handler apparatus is controlled by an electronic device (17).

REFERENCES:
patent: 4788702 (1988-11-01), Howe et al.

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