X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1990-05-30
1992-06-23
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 70, 378197, 378 79, 25037010, G01N 2320
Patent
active
051250160
ABSTRACT:
Procedure based on X-ray diffraction for measuring the stress state of metals, in particular austenitic steels. In the procedure the detector surface (10) is inclined about an axis (A--A) lying on the surface of the sample (20) being examined which is substantially perpendicular to the direction of the stresses (.sigma..sub.xx) being examined. By means of the detector surface (10) the diameters (2S.sub.ax) of the so-called Debye rings in the direction of the surface being examined are recorded at two or several inclination angles (.psi.). The detector surface (10) has arcuate shape, as viewed in the direction (B--B) at right angles against the inclination axis (A--A), and in the procedure is used such as arcuate detector surface (10) elongated in the direction of said inclination axis (A--A) and narrow enough in the opposite direction that an inclination angle (.psi.) of the detector surface (10) large enough in view of the procedure's implementation is feasible. In the procedure a detector surface (10) is used by which the x-rays reflected from the sample are converted to photosignals, and that on the basis of these photosignals the stresses to be measured are determined. Also disclosed is a measuring instrument in which the detector surface (10) is located symmetrically on both sides of the collimator, and the detector surface (10) is provided with elements (10a, 10b;41) by which the X-ray radiation incident on the detector surface is converted into photosignals, and the apparatus further comprises a unit or units with which the stresses to be measured are derived on the basis of the photosignal.
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Korhonen Matti
Lindroos Veikko
Chu Kim-Kwok
Howell Janice A.
Outokumpu Oy
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