X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-06-21
2005-06-21
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S071000, C378S076000, C378S189000, C378S198000
Reexamination Certificate
active
06909773
ABSTRACT:
In one embodiment, a portable apparatus adapted to be battery powered is used to scan an object in situ with x-rays and measure the intensity of the diffracted x-rays. The apparatus includes a scanning head having an x-ray source that is battery powered and an x-ray detector. The x-ray source and the x-ray detector are aligned in one of a plurality of predetermined alignments such that x-rays from the x-ray source are incident upon an object at a specific angle and the x-ray detector is aligned to detect x-rays that are diffracted at a specific angle, wherein the specific angle is a Bragg angle for a particular plane of atoms in the object.
REFERENCES:
patent: 3868506 (1975-02-01), Ogiso
patent: 4095103 (1978-06-01), Cohen et al.
patent: 4426718 (1984-01-01), Hayashi et al.
patent: 4489425 (1984-12-01), Borgonovi
patent: 4561062 (1985-12-01), Mitchell
patent: 4686631 (1987-08-01), Ruud
patent: 5068883 (1991-11-01), DeHaan et al.
patent: 5111493 (1992-05-01), Siedband
patent: 5125016 (1992-06-01), Korhonen et al.
patent: 5148458 (1992-09-01), Ruud
patent: 5155751 (1992-10-01), Chohata et al.
patent: 5272746 (1993-12-01), Isobe et al.
patent: 5625664 (1997-04-01), Berkeley
patent: 6173036 (2001-01-01), Hossain et al.
patent: 6353656 (2002-03-01), LeVert et al.
patent: 6493420 (2002-12-01), Ruud
Article entitled “DRS-2 Digital Radioscopy System Accessories & Options” by SAIC Products, dated Feb. 23, 2002, pp. 1-2; http://www.saic.com;products/inspection/drs2/drs2-options.html.
Article entitled “DRS-2 Digital Radioscopy System Technical Specifications” by SAIC Products, dated Feb. 23, 2002, pp. 1-3; http://www.saic.com;products/inspection/drs2/drs2-tech.html.
Article entitled “DRS-2 Digital Radioscopy System Overview” by SAIC Products, dated Feb. 23, 2002, pp. 1-2; http://www.saic.com;products/inspection/drs2/drs2.html.
Article entitled “Technologies We Develop” by SAIC, dated Feb. 23, 2002, pp. 1-2; http://www.saic.com
de/.
Paul C. Schlesselman, B.S., M.S.; Thesis: Feasibility of Using X-ray Diffraction Linewidth for Nondestructive Evaluation: A Study of Brass; May, 1997; pp. 1-73.
Mueller Dennis William
Pinizzotto Russell F.
Ho Allen C.
MetScan Technologies, LLC
Thomas, Kayden, Horstemery, & Risley, LLP
LandOfFree
Portable x-ray diffractometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Portable x-ray diffractometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Portable x-ray diffractometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3519438