X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1984-08-10
1986-05-27
Smith, Alfred E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
364498, 378 83, G06F 1546, G06G 758, G01N 2327, G01T 136
Patent
active
045920826
ABSTRACT:
An external standard intensity ratio method is used for quantitatively determining mineralogic compositions of samples by x-ray diffraction. The method uses ratios of x-ray intensity peaks from a single run. Constants are previously determined for each mineral which is to be quantitatively measured. Ratios of the highest intensity peak of each mineral to be quantified in the sample and the highest intensity peak of a reference mineral contained in the sample are used to calculate sample composition.
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Clouse, Jr. Clifton E.
Grigsby T. N.
Hightower Judson R.
Sartorio Henry P.
Smith Alfred E.
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