Positioning device for an x-ray thickness measuring system

Details Positioning device for an x-ray thickness measuring system Positioning device for an x-ray thickness measuring system

1992-03-18

1994-05-03

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378206, 378208, G01B 1502

Patent

active

053094956

ABSTRACT:
In x-ray fluorescence systems, the screening prevents the bringing of the measurement spot into the correct position in relation to the x-ray beam using the naked eye. The use of a television camera with a screen as well as illuminating devices makes the measuring system expensive and complicates the use of the system. According to the invention, this is avoided in that use is made of an illuminated device, which operates using an optical system and which reproduces, by convergent light beams at their intersection, the correct height position, lateral position and forward/rearward position of the measurement object when the tray carrying the measurement object has been moved to a forward position away from the x-ray beam.

REFERENCES:
patent: 4534049 (1985-08-01), Koga
patent: 4648107 (1987-03-01), Latter
patent: 4799246 (1989-01-01), Fischer
patent: 4860329 (1989-08-01), Weiser et al.

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