X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1995-01-09
1996-12-31
Wong, Don
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378146, 378 988, 25037008, G01N 23201
Patent
active
055901697
ABSTRACT:
An imaging system for medical and industrial applications that includes scanning a plurality of points of the object zone with an intermittent collimated radiation incident beam, producing a series of first digital signals representing the energy of said beam that transmits through corresponding points of the zone along the incident line, producing a series of second digital signals representing the energy of said beam scattered off the incident line by the object, storing the informational content of the first and second digital signals contents to represent an incident image array and a scattered image array, and combining the information contents of substantially corresponding points of said arrays to produce a visual image display that is more accurate than either of the first and second image arrays alone. High and low energy beams can be used and three dimensional or depth information can also be derived.
REFERENCES:
patent: 4995107 (1991-02-01), Klingenbeck
patent: 5179581 (1993-01-01), Annis et al.
patent: 5313511 (1994-05-01), Annis et al.
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