LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical element, production method of optical element, optical s

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical measuring device

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical member for photolithography and method for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical sample X-ray testing apparatus and method for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical scheme for high flux low-background two-dimensional...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical structures and methods for x-ray applications

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical thin film and mirror using the same

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optical unit and associated method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optimized x-ray energy for high resolution imaging of...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Optimized x-ray energy for high resolution imaging of...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Orientation of crystals

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Oscillation radiography camera and method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Parallel x-ray nanotomography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Phase contrast imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Phase contrast X-ray device for creating a phase contrast...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Phase-contrast X-ray CT apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Photo-sensor fiber-optic stress analysis system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Photo-sensor fiber-optic stress analysis system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Plane-grating monochromator