X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-12-26
2006-12-26
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
Reexamination Certificate
active
07154992
ABSTRACT:
The invention concerns a phase contrast X-ray device for creating a phase contrast image of at least one object with at least one X-ray source for generating an X-radiation that has a specific spatial coherence within a specific optical distance to the X-ray source and at least one evaluation unit for converting the X-radiation after the X-radiation has passed through the object arranged within the optical distance to the X-ray source in the phase contrast image of the object. The X-ray source has an output ranging from 50 W up to and including 10 kW and a spatial coherence length of the X-radiation has been selected within the optical distance to the X-ray source ranging from 0.05 μm.
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Young & Thompson
Yun Jurie
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