Phase contrast imaging

Details Phase contrast imaging Phase contrast imaging

2011-01-11

2011-01-11

Glick, Edward J (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S062000, C378S070000

Reexamination Certificate

active

07869567

ABSTRACT:
Phase contrast imaging is achieved using a sample mask8and a detector mask (6). X-rays emitted from x-ray source (2) are formed into individual beams (16) by sample mask which pass through sample (14) and arrive at individual pixels (12) of the detector (4) through detector mask (6). The individual x-ray beams are arranged to hit the pixel edge (20) of individual rows of pixels, individual columns of pixels or individual pixels. Small deviations θ in the individual beams (16) cause a significant increase or decrease in the signal hitting the exposed area (22) of the pixel resulting in a significant phase contrast signal.

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Pfeiffer, “Phase retrieval and differential phase-contrast . . . ”, Nature Physics, vol. 2, No. 4, Apr. 2006, pp. 258-261.

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