X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1986-08-08
1988-11-29
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 71, 378 79, G01N 23207
Patent
active
047887028
ABSTRACT:
The invention comprises apparatus for determining the orientation of the crystallographic axes of a single crystal. The crystal is rotated on a turntable while an X-ray beam containing characteristic radiation is directed onto it. A stationary position-sensitive detector, preferably positioned at right angles to the beam detects Bragg reflections from the crystal, and computing means responsive to the signals from the detector, and signals representing the angular position of the turntable determines the crystal orientation.
REFERENCES:
patent: 3784816 (1974-01-01), Abrahamsson
patent: 3870880 (1975-03-01), Merigoux et al.
Howe Stephen
Rogers Donald
Fields Carolyn E.
Porta David P.
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