LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

In-situ temperature measurement using X-ray diffraction

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

In-situ X-ray diffraction system using sources and detectors...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Inclined monochromator for high heat-load synchrotron x-ray radi

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Inspection system with no intervening belt

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Instrument and method for focusing X-rays, gamma rays and neutro

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Instrumentation for conditioning X-ray or neutron beams

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Integral lens for high energy particle flow, method for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Integrated crystal mounting and alignment system for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Kinematic X-ray analyses apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Large angle solid state position sensitive x-ray detector system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Laser plasma x-ray generation apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Laue camera

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Laue crystallographic orientation mapping system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Linear prediction of structure factors in x-ray crystallography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Lobster eye X-ray imaging system and method of fabrication...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Low activity nuclear density gauge

Reissue Patent

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Low activity nuclear density gauge

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Low-cost, high precision goniometric stage for x-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Low-damage multilayer mirror for the soft X-ray region