Instrument and method for focusing X-rays, gamma rays and neutro

Details Instrument and method for focusing X-rays, gamma rays and neutro Instrument and method for focusing X-rays, gamma rays and neutro

1982-03-25

1984-01-31

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378145, G01N 2320

Patent

active

044294115

ABSTRACT:
A crystal diffraction instrument or diffraction grating instrument with an improved crystalline structure or grating spacing structure having a face for receiving a beam of photons or neutrons and diffraction planar spacing or grating spacing along that face with the spacing increasing progressively along the face to provide a decreasing Bragg diffraction angle for a monochromatic radiation and thereby increasing the usable area and acceptance angle. The increased planar spacing for the diffraction crystal is provided by the use of a temperature differential across the crystalline structure, by assembling a plurality of crystalline structures with different compositions, by an individual crystalline structure with a varying composition and thereby a changing planar spacing along its face, and by combinations of these techniques. The increased diffraction grating element spacing is generated during the fabrication of the diffraction grating by controlling the cutting tool that is cutting the grooves or controlling the laser beam, electron beam or ion beam that is exposing the resist layer, etc. It is also possible to vary this variation in grating spacing by applying a thermal gradient to the diffraction grating in much the same manner as is done in the crystal diffraction case.

REFERENCES:
patent: 3143651 (1964-08-01), Giacconi
patent: 3376415 (1968-04-01), Krogstad
patent: 3777156 (1973-12-01), Hammond
patent: 3980883 (1976-09-01), Franks
patent: 3991309 (1976-11-01), Hauer
patent: 4132654 (1979-01-01), Braun
patent: 4192994 (1980-03-01), Kastner

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