X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1992-07-06
1994-02-15
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 73, 378 70, G21K 700
Patent
active
052873951
ABSTRACT:
A double crystal monochromator including two identical, parallel crystals, each of which is cut such that the normal to the diffraction planes of interest makes an angle less than 90 degrees with the surface normal. Diffraction is symmetric, regardless of whether the crystals are symmetrically or asymmetrically cut, enabling operation of the monochromator with a fixed plane of diffraction. As a result of the inclination of the crystal surface, an incident beam has a footprint area which is elongated both vertically and horizontally when compared to that of the conventional monochromator, reducing the heat flux of the incident beam and enabling more efficient surface cooling. Because after inclination of the crystal only a fraction of thermal distortion lies in the diffraction plane, slope errors and the resultant misorientation of the diffracted beam are reduced.
REFERENCES:
patent: 5016265 (1991-04-01), Hoover
Ali M. Khounsary, "A novel monochromator for high heat load synchrotron x-ray radiation", Rev. Sci. Instrum. 63(1), Jan. 1992, pp. 461-464.
P. L. Cowan et al., "Self-filtering crystal monochromators for synchrotron x radiation", Rev. Sci. Instrum. 60(7), Jul. 1989, pp. 1987-1990.
R. C. Evans et al., "A `Parallel-Beam` Concentrating Monochromator for X-Rays", Acta Cryst. (1948) 1, pp. 124-129.
Jaromir Hrdy.sup.a), "Double crystal monochromator for synchrotron radiation with decreased radiation power density", Rev. Sci. Instrum. 63(1), Jan. 1992, pp. 459-460.
Anderson Thomas G.
Moser William R.
Park Daniel D.
Porta David P.
The United States of America as represented by the United States
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