X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1984-03-12
1987-01-13
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 79, 378 84, 378 81, G01N 2320, G01N 23207, G21K 106
Patent
active
046370412
ABSTRACT:
In an X-ray analysis apparatus, a moving mechanism is provided by a main guide member along which a main slide device can be displaced. Rotatably connected with the main slide device is a detector guide member along which a detection slide device is displaced. The main slide device, as well as the detection slide device, and an axis of rotation relative to an end of the main guide member are connected to a common central axis by respective arms which can be mutually rotated with them. The main slide device and the detection slide device can each be equipped with a drive motor where the motor for the main slide device is preferably driven first, and the motor for the detector slide device is driven by signals derived from displacing the main slide device. The rotatable arms ensure an optimum orientation of a crystal holder incorporated onto the main slide device, and a detection holder incorporated onto the detector slide device with respect to each other and with respect to a point of focus of an X-ray source.
REFERENCES:
patent: 2898469 (1959-08-01), Rose
patent: 3051833 (1962-08-01), Schumacher
patent: 3123710 (1964-03-01), Neuhaus
patent: 3384756 (1968-05-01), Hasler et al.
patent: 3445653 (1969-05-01), Tomura
patent: 4446568 (1984-05-01), Williams et al.
Brinkgreve Peter
Koningsberger Diederik C.
Church Craig E.
Miller Paul R.
Technische Hogeschool Eindhoven
Wieland Charles
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