Imaging system to compensate for x-ray scatter

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

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C378S007000, C378S098400

Reexamination Certificate

active

10837405

ABSTRACT:
A system includes acquisition of a first image of a first radiation field, at least a portion of the first radiation field comprising radiation attenuated by a device, and the first image including a representation of first scatter radiation generated during acquisition of the first image, acquisition of a second image of a second radiation field, at least a portion of the second radiation field comprising radiation attenuated by a volume corresponding to the device, and the second image including a representation of second scatter radiation generated during acquisition of the second image, and modification of the second image based on the first image to compensate for the second scatter radiation.

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patent: 2004/0101108 (2004-05-01), Charleton
patent: 2004/0228435 (2004-11-01), Russell
patent: 2004/0252810 (2004-12-01), Tsujii
patent: 105618 (1984-04-01), None
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patent: 689047 (1995-12-01), None

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