X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1993-10-14
1996-01-09
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 57, G01N 23203
Patent
active
054835690
ABSTRACT:
An inspection system for inspecting objects with penetrating radiation having a conveying means with first and second portions which are separated by a gap. Illumination by penetrating radiation is provided in a scanning plane which is located in the gap, and the system may be used for the inspection of thin objects. Additionally, the illumination may be arranged in the inspection of normal size objects, e.g., suitcases or cargo boxes, so that it does not include a ray which is perpendicular to any face of the object. Further, the relative orientation of the scanning plane and the faces of the object may be arranged so that the illumination does not include a ray which is parallel to any face of the object. A scanning configuration wherein the illumination does not include a ray which is perpendicular or parallel to any face of an object having parallel faces, for example, a rectangular solid, results in a display projection of the object which appears to be three dimensional.
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Bukshpan et al, "Detection of Imperfections by Means of Narrow Beam Gamma Scattering", Materials Evaluation, 33 (10, Oct. 1975, pp. 243-245.
American Science and Engineering
Fields Carolyn E.
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