LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Mounting apparatus for double crystal monochromators and the lik

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multi-component flow measurement and imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multi-detector EDXRD

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multi-detector EDXRD

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multi-energy imaging system and method using optic devices

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multi-layer film spectroscopic element for boron fluorescene...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multi-layer structure with variable bandpass for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multi-layer X-ray-reflecting mirrors with reduced internal stres

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multichannel radiography employing scattered radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multifunction X-ray analysis system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multilayer film for X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multilayer film reflecting mirror for X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multilayer film reflector and X-ray exposure system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multilayer film reflector for soft X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multilayer films with sharp, stable interfaces for use in...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multilayer optics with adjustable working wavelength

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multiple corner Kirkpatrick-Baez beam conditioning optic assembl

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multiple image collection and synthesis for personnel screening

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Multiple scatter system for threat identification