Multi-detector EDXRD

Details Multi-detector EDXRD Multi-detector EDXRD

2008-01-22

2008-01-22

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S083000

Reexamination Certificate

active

11532162

ABSTRACT:
A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors simultaneously in different, respective positions, whereby the detectors generate respective outputs. Energy-dispersive processing is applied to the outputs of the detectors so as to identify one or more X-ray diffraction lines of the sample.

REFERENCES:
patent: 6108398 (2000-08-01), Mazor et al.
patent: 6118850 (2000-09-01), Mayo et al.
patent: 6389102 (2002-05-01), Mazor et al.
patent: 6754304 (2004-06-01), Kumakhov
U.S. Appl. No. 60/717,820.
V.R. Albertini, et al., “Energy-Dispersive X-Ray Diffraction on Thin Films and its Application To Superconducting Samples”, J. Appl. Cryst. (2003). 36, 43-47.

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