Method and apparatus for detecting flaws in single crystal test

Details Method and apparatus for detecting flaws in single crystal test Method and apparatus for detecting flaws in single crystal test

1985-10-03

1987-09-22

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 71, 378147, 378150, 378151, 378152, G01N 23207

Patent

active

046960244

ABSTRACT:
A gamma diffractometer is used for examining or testing samples from the materials flaw aspect. More particularly, single crystal blades of turbo engines are inspected by Roentgen radiation and evaluation of reflections with regard to their half peak width and spacings in the profile or curve representing irradiation intensity (I) as a function of a rotational angle (.alpha.) of a test sample, said spacings representing lattice planes of a plurality of single crystal grains. The half peak widths and the spacings provide an information regarding the presence or absence of material flaws.

REFERENCES:
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patent: 4380820 (1983-04-01), Cutter
patent: 4404682 (1983-09-01), Hayashi et al.
patent: 4412345 (1983-10-01), Workman et al.
patent: 4419764 (1983-12-01), Kinanen
patent: 4429411 (1984-01-01), Smither
patent: 4535469 (1985-08-01), Brandt
patent: 4592083 (1986-05-01), O'Brien

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