Means and method for determining residual stress on a polycrysta

Details Means and method for determining residual stress on a polycrysta Means and method for determining residual stress on a polycrysta

1983-01-14

1984-12-18

Smith, Alfred E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

364508, G01N 2320

Patent

active

044894252

ABSTRACT:
A polycrystalline sample is irradiated with a collimated beam of substantially monochromatic X-ray radiation to form a diffraction come which extends and expands outwardly from the sample. A substantially planar, two-dimensional, position sensitive detector is disposed across the cone to intercept and thereby form a two-dimensional image of at least a substantial portion of the cone's cross-sectional periphery. A theoretical relationship exists between the shape of the cone's image and the residual stress in the sample such that the image can be analyzed to quantitatively determine the residual stress.

REFERENCES:
patent: 2259708 (1941-10-01), Schiebold
patent: 3023311 (1962-02-01), Bessen
patent: 3934138 (1976-01-01), Bens
patent: 4042825 (1977-08-01), Ruud
Hayama, et al., "Automation of X-Ray Stress Measurement by Small Digital Computer", 1973, Symposium on Mechanical Behavior of Materials, Kyoto, Japan, Aug. 21-23, 1973.

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