Method and an apparatus for examining an object by using...

Details Method and an apparatus for examining an object by using... Method and an apparatus for examining an object by using...

2006-08-22

2006-08-22

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C250S358100, C378S019000

Reexamination Certificate

active

07095820

ABSTRACT:
A method for examining an object includes the steps of: producing ionizing radiation photons; providing other particles or photons, each of which carrying information regarding position, time, movement direction, and/or energy of a respective one of said ionizing radiation photons before having interacted with said object to be examined; detecting each of said other particles or photons to retrieve said information; having said ionizing radiation photons to interact with said object to be examined; detecting at least some of said ionizing radiation photons after having interacted with said object to retrieve information regarding position, time, movement direction, and/or energy of each of said detected ionizing radiation photons; correlating each of said detected ionizing radiation photons with a respective one of said other particles or photons; and deducing information of said examined object by means of said information as retrieved in the steps of detection.

REFERENCES:
patent: 4598415 (1986-07-01), Luccio et al.
patent: 4891521 (1990-01-01), Danos
patent: 6285028 (2001-09-01), Yamakawa
patent: 6414317 (2002-07-01), Francke et al.
patent: WO 01/94979 (2001-12-01), None
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