Method and apparatus for determining both density and atomic num

Details Method and apparatus for determining both density and atomic num Method and apparatus for determining both density and atomic num

1996-05-31

1998-03-17

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 86, 378 88, G01N 23201

Patent

active

057295824

ABSTRACT:
An x-ray backscatter tomography system includes a collimated x-ray source for directing a collimated beam towards a target at a select position and orientation, a first detector array for measuring photons scattered at a selected first angle, and a second detector array for measuring photons scattered at a selected second angle different from the first angle. The system is also responsive to the first and second detectors for calculating the density and atomic number of the target.

REFERENCES:
patent: 4029963 (1977-06-01), Alvarez et al.
patent: 4768214 (1988-08-01), Bjorkholm
patent: 5420905 (1995-05-01), Bertozzi

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