X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1990-02-05
1991-07-02
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 86, 250308, 33702, G01B 1502
Patent
active
050291947
ABSTRACT:
Measuring the distance to a surface of an object using ultrasonic energy pulses, an ultrasonic energy pulse is directed toward the object and the time is measured for the reflection to return so as to determine the distance to the object. A reference ultrasonic pulse is directed through a fixed and known distance to provide a reference measurement. To enhance the accuracy of the measurement, the air in the region traversed by the ultrasonic pulses is mixed by directing a swirling flow of air in this region so that the temperature of the air in the path of the reference measurement is more nearly representative of the temperature of the air where the distance measurement is taken.
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patent: 4979197 (1990-12-01), Troxler, Sr. et al.
Regimand Ali
Young James E.
Fields Carolyn E.
Porta David P.
Troxler Electronic Laboratories, Inc.
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