X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-05-09
2009-02-03
Souw, Bernard E (Department: 2881)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S006000, C378S007000, C378S070000, C378S086000, C378S087000, C378S098110, C378S098120, C250S358100, C250S370080, C250S370090
Reexamination Certificate
active
07486773
ABSTRACT:
A system may include emission of megavoltage radiation from a megavoltage radiation source, acquisition of a first image using an imaging device while first megavoltage radiation is emitted from the megavoltage radiation source and while a plurality of elements is between the megavoltage radiation source and the imaging device, and determination of an amount of scatter radiation based at least on areas of the acquired image corresponding to the plurality of elements. In some aspects, at least one of the plurality of elements is substantially pointed toward a focal spot of the megavoltage radiation source.
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Ruola Ning, Xiangyang Tang and David Conover, X-ray scatter correction algorithm for cone beam CT imaging, Medical Physics, vol. 31 No. 5, May 2004, pp. 1195-1202. © 2004 Am. Assoc. Phys. Med.
Maltz Jonathan S.
Svatos Michelle M.
Zheng Zirao
Siemens Medical Solutions USA , Inc.
Souw Bernard E
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