X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1989-03-24
1990-04-17
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 86, G01B 1502
Patent
active
049187120
ABSTRACT:
The invention provides a device for delivering an indication about the mass per unit volume of the contents of an elementary volume, comprising a directional X or gamma radiation source and a directional photoelectronic photon detector, and wherein said source and/or said detector are mounted for rotation on a common support, about an axis orthogonal to the plane defined by the axis of the radiation beam emitted by said source and by the axis of the reception channel of said detector, and means are provided for moving said common support in a direction orthogonal to the axis of rotation of said source and/or of said detector.
REFERENCES:
patent: 2997586 (1961-08-01), Scherbatskoy
patent: 3439166 (1969-04-01), Chope
patent: 3505520 (1970-04-01), Stewart et al.
patent: 3792252 (1974-02-01), Afanasiev et al.
patent: 4525854 (1985-06-01), Molbert et al.
patent: 4820919 (1989-04-01), Berg et al.
Babot Daniel
Le Floc'h Christian
Mazeron Bernard
Peix Gilles
Church Craig E.
Societe Nationale Industrielle et
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