X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1985-11-14
1988-06-07
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378147, 378149, 378 86, G21K 102, G01N 23201, G01N 23203
Patent
active
047501960
ABSTRACT:
The invention relates to a device for examining a body by means of gamma rays or X-rays, in which a body to be examined is irradiated by a plurality of primary beams having a comparatively small cross-section. The scattered radiation produced is intercepted by detector devices, at least one of which is associated each time with a respective primary beam, and the detector device and an associated slit which images the primary beam on the detector device is arranged so that the detector device is struck essentially only by scattered radiation from this one primary beam. Preferably, the detectors are arranged between the body to be examined and the radiation source, so that they can intercept only the back-scattered radiation.
REFERENCES:
patent: 3505520 (1967-10-01), Stewart et al.
patent: 4423522 (1983-12-01), Harding
patent: 4480332 (1984-10-01), Strecker
Fields Carolyn E.
Hynds Joseph A.
Miller Paul R.
U.S. Philips Corp.
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