X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1993-02-05
1995-02-28
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 87, 378 88, 378149, G01N 23201
Patent
active
053944534
ABSTRACT:
A device for measuring the pulse transfer spectrum of X-ray quanta, includes a polychromatic X-ray source and an energy-resolving detector device for the scattered X-ray quanta. A secondary diaphragm device, arranged between the examination zone in which the object whose pulse transfer spectrum is to be determined is situated, and the detector device ensure on the one that each detector element of the detector device can detect scattered radiation only at a comparatively accurately defined scatter angle, and that the scatter angles of the various detector elements do not excessively deviate from one another.
REFERENCES:
patent: 3197638 (1965-07-01), Sinclair
patent: 4951305 (1990-08-01), Moore et al.
patent: 5007072 (1991-04-01), Jenkins et al.
patent: 5008911 (1991-04-01), Harding
Porta David P.
Slobod Jack D.
U.S. Philips Corporation
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