Detection methods and apparatus for non-destructive inspection o

Details Detection methods and apparatus for non-destructive inspection o Detection methods and apparatus for non-destructive inspection o

1986-12-31

1989-04-11

LaRoche, Eugene R.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

2505051, G01N 23201, G01N 23203

Patent

active

048213047

ABSTRACT:
Apparatus and methods for non-destructive radiation inspection including a radiation source, collimator, translatable slotted mask, adjustable resolution mask, and spaced scintillation counters is provided. Also provided is apparatus for one-sided inspection of materials which include an attenuation wedge, an X-ray tube alignment system and combination radiation direct detection on scatter detection arrays.

REFERENCES:
patent: 3147638 (1965-07-01), Sinclair
patent: 3243589 (1966-03-01), Sinclair
patent: 4229651 (1980-10-01), Danos
patent: 4437006 (1984-03-01), Morgan et al.
patent: 4651002 (1987-03-01), Anno
Proposal for Development of the Slot Camera X-Ray Imaging System, Submitted by DMX Labs, 1983.
Yester, Barnes and King, Med. Phys. 8(2), Mar./Apr. 1981, p. 158.
Johns and Yaffe, Med. Phys. 9(2), Mar./Apr. 1982, p. 231.
Niklason, Sorenson and Nelson, Med. Phys. 8(5), Sep./Oct. 1981, p. 677.

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