Device for measuring the momentum transfer spectrum of X-ray qua

Details Device for measuring the momentum transfer spectrum of X-ray qua Device for measuring the momentum transfer spectrum of X-ray qua

1996-02-14

1997-03-18

Tokar, Michael J.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 984, G01N 23201

Patent

active

056129882

ABSTRACT:
The invention relates to a device for measuring the momentum transfer spectrum of X-ray quanta elastically scattered in an examination zone, comprising an X-ray source and a detector device with a plurality of detector elements, one of which serves to measure a reference radiation beam. Attractive results are obtained in that between the examination zone and the X-ray source there is arranged at least one scatter member which scatters the X-rays emitted by the X-ray source, the reference radiation beam being formed from the part of the scattered radiation which reaches the reference detector element rectilinearly through the examination zone.

REFERENCES:
patent: 5231652 (1993-07-01), Harding
patent: 5265144 (1993-11-01), Harding et al.
patent: 5394453 (1995-02-01), Harding

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