X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2001-07-05
2004-02-10
Arana, Louis (Department: 2859)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S079000
Reexamination Certificate
active
06690763
ABSTRACT:
FIELD OF THE INVENTION
The present invention is directed to a device for micro-manipulation of small samples. More specifically, the present invention is to provide x-y movement or x-y-z movement to a sample affixed to a goniometer.
BACKGROUND OF THE INVENTION
U.S. Pat. No. 4,058,731 discloses a corpuscular-beam apparatus including a specimen holder having at least two degrees of freedom of translation and at least one degree of freedom of rotation, and control means for correcting the translational coordinates of the specimen holder automatically when the specimen holder is rotated and retraining a predetermined specimen point in its position in the apparatus.
U.S. Pat. No. 4,641,329 discloses a fixture for supporting and aligning small samples of material on a goinometer for x-ray diffraction.
U.S. Pat. No. 4,710,259 discloses a method and apparatus for x-raying a crystal.
SUMMARY OF THE INVENTION
The present invention is directed to a x-y-axis device and a x-y-z-axis device for micro-manipulating or positioning a crystal for x-ray diffraction. More specifically, the devices which may be placed on the head on a goniometer have small footprints (small in size). The sample may be moved and recorded in step resolutions of 1 micron over an extended range of motion.
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Copeland Kent D.
Nienaber Terrence J.
Robertson William C.
Arana Louis
Duane Morris LLP
Oceaneering International Inc.
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