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Tertiary CAM cell

Static information storage and retrieval – Associative memories – Ferroelectric cell
Reexamination Certificate

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Test apparatus for semi-conductor memory device

Static information storage and retrieval – Read/write circuit – Differential sensing
Patent

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Test apparatus for static-type semiconductor memory devices

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Test apparatus of semiconductor integrated circuit and...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Test array and method for testing memory arrays

Static information storage and retrieval – Read/write circuit – Testing
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Test cell for analyzing a property of the flash EEPROM cell...

Static information storage and retrieval – Floating gate – Particular biasing
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Test circuit

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Test circuit and method for use in semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
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Test circuit and test method for semiconductor memory

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Test circuit device capable of identifying error in stored...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Test circuit device for semiconductor memory apparatus

Static information storage and retrieval – Read/write circuit – Testing
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Test circuit for a semiconductor memory device and method for bu

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Test circuit for an analog measurement of bit line signals...

Static information storage and retrieval – Systems using particular element – Ferroelectric
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Test circuit for an unprogrammed OTP memory array

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Test circuit for flash memory device and method thereof

Static information storage and retrieval – Read/write circuit – Testing
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Test circuit for measuring sense amplifier and memory...

Static information storage and retrieval – Read/write circuit – Testing
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Test circuit for multi-port memory device

Static information storage and retrieval – Read/write circuit – Testing
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Test circuit for multi-port memory device

Static information storage and retrieval – Addressing
Reexamination Certificate

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Test circuit for non-volatile storage cell

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Test circuit for refresh counter of clock synchronous type semic

Static information storage and retrieval – Read/write circuit – Data refresh
Patent

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