Test circuit and method for use in semiconductor memory device

Details Test circuit and method for use in semiconductor memory device Test circuit and method for use in semiconductor memory device

2011-06-14

2011-06-14

Zarabian, Amir (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S230030, C365S200000

Reexamination Certificate

active

07961535

ABSTRACT:
A test circuit and method for use in a semiconductor memory device is provided. The test method for use in a semiconductor memory device including a plurality of memory blocks may include sequentially enabling a plurality of word lines by applying a stress to the wordlines and performing a test operation, in response to sequentially applied test addresses, each of the word lines being sequentially selected from the plurality of memory blocks and enabled.

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