Test circuit for multi-port memory device

Details Test circuit for multi-port memory device Test circuit for multi-port memory device

2009-05-28

2010-10-05

Nguyen, Tuan T. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S230050, C365S230030

Reexamination Certificate

active

07808851

ABSTRACT:
A semiconductor memory device includes a read bus line for transferring read data; a write bus line for transferring write data; and a temporary data storage unit connected between the read bus line and the write bus line and controlled by a test mode signal enabled during a test mode.

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