LandOfFree - US Patents - Listing for Static information storage and retrieval

Static information storage and retrieval – Read/write circuit – Testing

Test parallelism increase by tester controllable switching...

Static information storage and retrieval – Floating gate – Particular connection

Test pattern structure for endurance test of a flash memory devi

Static information storage and retrieval – Read/write circuit – Including level shift or pull-up circuit

Test potential transfer circuit

Static information storage and retrieval – Read/write circuit – Testing

Test signal generator for semiconductor integrated circuit memor

Static information storage and retrieval – Floating gate – Particular connection

Test structure and method to characterize charge gain in a non-v

Static information storage and retrieval – Read/write circuit – Testing

Test structure for detecting bridging of DRAM capacitors

Static information storage and retrieval – Read/write circuit – Testing

Test structure for measuring a junction resistance in a DRAM...

Static information storage and retrieval – Addressing – Plural blocks or banks

Test structure for the measurement of contact to gate...

Static information storage and retrieval – Read/write circuit – Testing

Test structures for measuring DRAM cell node junction...

Static information storage and retrieval – Addressing – Sync/clocking

Test system for segmented memory

Static information storage and retrieval – Floating gate – Data security

Test terminal negation circuit for protecting data integrity

Static information storage and retrieval – Read/write circuit – Testing

Testability apparatus and method for faster data access and sili

Static information storage and retrieval – Read/write circuit – Testing

Testable nonvolatile semiconductor device

Static information storage and retrieval – Read/write circuit – Testing

Testing a memory device having field effect transistors...

Static information storage and retrieval – Floating gate – Particular connection

Testing a non-volatile memory

Static information storage and retrieval – Floating gate – Particular biasing

Testing an integrated circuit device

Static information storage and retrieval – Read/write circuit – Bad bit

Testing and evaluation of a semiconductor memory containing redu

Static information storage and retrieval – Read/write circuit – Testing

Testing and repair of wide I/O semiconductor memory devices desi

Static information storage and retrieval – Read/write circuit – Bad bit

Testing arrangement for a DRAM with redundancy