Testing an integrated circuit device

Details Testing an integrated circuit device Testing an integrated circuit device

1995-08-21

1997-07-29

Nguyen, Tan T.

Static information storage and retrieval

Floating gate

Particular biasing

365201, G11C 1700

Patent

active

056527217

ABSTRACT:
An integrated circuit device has a set of storage elements which are not reprogrammable or which are slow to reprogram and, associated with each storage element, a latch. With each storage element and latch there is associated a switch circuit which can either be connected to supply as an output a signal from the storage element or from the latch. In a test mode, the latches hold test data bits for testing the device and the switch circuits are operated to supply control signals from the test data bits. In a normal mode, the switch circuits are operated to supply control signals from the storage elements. The integrated circuit device includes functional circuitry which takes the form of programming circuitry for programming the storage elements responsive to the control signals.

REFERENCES:
patent: 5206583 (1993-04-01), Dawson et al.
patent: 5233566 (1993-08-01), Imamiya et al.

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