Test for weak SRAM cells

Test interface circuit and semiconductor integrated circuit...

Test key for detecting overlap between active area and deep...

Test method and circuit for semiconductor memory

Test method for a semiconductor memory

Test method for contacts in SRAM storage circuits

Test method for ferroelectric memory

Test method for high speed memory devices in which limit...

Test method for semiconductor memory device and...

Test method of integrated circuit devices by using a dual edge c

Test mode activation and data override

Test mode activation and data override

Test mode controller

Test mode controller

Test mode entrance through clocked addresses

Test mode flag signal generator of semiconductor memory device

Test mode for detecting a floating word line

Test mode for IPP current measurement for wordline defect...

Test mode for verification of on-chip generated row addresses

Test mode method and apparatus for internal memory timing...