Semiconductor memory device with built-in test circuit and metho

Semiconductor memory device with cascaded burn-in test capabilit

Semiconductor memory device with circuit executing burn-in...

Semiconductor memory device with comparing circuit for facilitat

Semiconductor memory device with data compression test function

Semiconductor memory device with discriminator for diagnostic mo

Semiconductor memory device with enhanced reliability

Semiconductor memory device with function of carrying out logic

Semiconductor memory device with improved defect elimination...

Semiconductor memory device with improved sensing margin

Semiconductor memory device with improved substrate arrangement

Semiconductor memory device with improved test efficiency

Semiconductor memory device with inhibiting test mode cancellati

Semiconductor memory device with IO compression test mode

Semiconductor memory device with logic level responsive testing

Semiconductor memory device with provision of pseudo-acceleratio

Semiconductor memory device with reset during a test mode

Semiconductor memory device with stress circuit and method for s

Semiconductor memory device with switching element for...

Semiconductor memory device with test mode and testing...