Static information storage and retrieval – Read/write circuit – Testing
Patent
1998-10-02
2000-07-18
Nelms, David
Static information storage and retrieval
Read/write circuit
Testing
365202, 36518904, 36523008, G11C 700
Patent
active
060916516
ABSTRACT:
I/O lines in an I/O gate-sense amplifier portion are arranged in the order of IOA, /IOB, IOB, and /IOA. As a result, the potentials of adjacent I/O lines are necessarily different at the time of writing/reading the same data to/from a plurality of memory cells during a multi-bit test. Therefore, a short-circuit fault caused between adjacent I/O lines can be detected at the same time.
REFERENCES:
patent: 4873669 (1989-10-01), Furutani et al.
patent: 5021998 (1991-06-01), Suzuki et al.
patent: 5241501 (1993-08-01), Tanaka
patent: 5600591 (1997-02-01), Takagi
patent: 5818792 (1998-10-01), Sasaki et al.
Furutani Kiyohiro
Hamamoto Takeshi
Kikuda Shigeru
Le Thong
Mitsubishi Denki & Kabushiki Kaisha
Nelms David
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