Semiconductor memory device with cascaded burn-in test capabilit

Details Semiconductor memory device with cascaded burn-in test capabilit Semiconductor memory device with cascaded burn-in test capabilit

1998-12-28

2000-01-25

Dinh, Son T.

Static information storage and retrieval

Read/write circuit

Testing

365194, G11C 700

Patent

active

06018485&

ABSTRACT:
A semiconductor memory device with a cascaded burn-in test capability for a plurality of memory cell blocks. A delayed feedback signal is communicated between memory cell block selection circuits to create the cascade burn-in.

REFERENCES:
patent: 5638331 (1997-06-01), Cha et al.
patent: 5657282 (1997-08-01), Lee
patent: 5680362 (1997-10-01), Parris et al.
patent: 5732032 (1998-03-01), Park et al.

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