Semiconductor memory device capable of reliably performing...

Semiconductor memory device capable of simultaneously designatin

Semiconductor memory device capable of storing data of...

Semiconductor memory device capable of suppressing a...

Semiconductor memory device capable of switching output data...

Semiconductor memory device connected to memory controller...

Semiconductor memory device enabling reduction of test time...

Semiconductor memory device enabling test of timing standard...

Semiconductor memory device equipped with control circuit...

Semiconductor memory device equipped with serial/parallel...

Semiconductor memory device executing a memory test in a plurali

Semiconductor memory device externally confirmable of a currentl

Semiconductor memory device for detecting defective memory cells

Semiconductor memory device for inputting and outputting data in

Semiconductor memory device for masking all bits in a test...

Semiconductor memory device for measuring internal voltage

Semiconductor memory device for reducing number of input...

Semiconductor memory device for testifying over-driving...

Semiconductor memory device for testing redundancy cells

Semiconductor memory device for testing redundancy cells