Semiconductor memory device for measuring internal voltage

Details Semiconductor memory device for measuring internal voltage Semiconductor memory device for measuring internal voltage

2006-09-29

2009-08-18

Tran, Michael T (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S226000

Reexamination Certificate

active

07577050

ABSTRACT:
A semiconductor memory device includes a plurality of internal voltage measuring units, each for driving data input from a memory bank to output the data when a test signal is deactivated, and outputting a corresponding one of internal voltages used in the semiconductor memory device when the test signal is activated.

REFERENCES:
patent: 5303197 (1994-04-01), Miyashita et al.
patent: 6226200 (2001-05-01), Eguchi et al.
patent: 6549480 (2003-04-01), Hosogane et al.
patent: 05-303889 (1993-11-01), None
patent: 11-3600 (1999-01-01), None
patent: 10-2001-0105564 (2001-11-01), None
patent: 10-2005-0013741 (2005-02-01), None
Korean Office Action issued in Korean Patent Application No. KR 10-2006-0044162, mailed Apr. 23, 2007.
Korean Office Action with English Translation, issued in Korean Patent Application No. KR 10-2006-0044162, issued on Feb. 18, 2008.

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