Semiconductor memory device capable of storing data of...

Details Semiconductor memory device capable of storing data of... Semiconductor memory device capable of storing data of...

2005-11-04

2008-10-07

Hur, J. H. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C714S718000, C714S719000, C714S720000

Reexamination Certificate

active

07433252

ABSTRACT:
A semiconductor memory device to which information of different data bits can be written, and a method of electrically testing the semiconductor memory device are provided. In a mode for testing a memory cell array of the semiconductor memory device, the semiconductor memory comprises a control signal generation pad capable of writing non-identical data to data input/output pads of each group when data is written to the memory cell array.

REFERENCES:
patent: 6323664 (2001-11-01), Kim et al.
patent: 6636998 (2003-10-01), Lee et al.
patent: 7120066 (2006-10-01), Xi
patent: 2005/0108607 (2005-05-01), Chae et al.
patent: 2001-135786 (2001-05-01), None
patent: 2002-056696 (2002-02-01), None
patent: 2001-10733 (2001-02-01), None
patent: 2001-27864 (2001-04-01), None
English language abstract of Korean Publication No. 2001-10733.
English language abstract of Korean Publication No. 2001-27864.
English language abstract of Japanese Publication No. 2001-135786.
English language abstract of Japanese Publication No. 2002-056696.

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